The COB (standard equipment compatible with 100G/200G/400G/800G products), COC and other product aging testing systems independently developed by Yunzhonggu Intelligent Technology Co., Ltd. are suitable for reliability verification in semiconductor optical chips, optical communication, consumer electronics and other fields.

Through systematic integration, a complete chip reliability evaluation system can be constructed, with functions such as chip temperature control, LIV testing, spectral analysis, and automated testing. The testing efficiency is high, providing efficient and accurate technical support for chip quality control and performance optimization.

At present, the product has been successfully mass-produced and operated in multiple leading enterprises in the industry.