The YG-W3210 wafer AOI inspection equipment is an automatic optical inspection device with micrometer level accuracy launched by Yunzhonggu. It is based on advanced optical imaging systems and is equipped with various lighting schemes to solve imaging problems of different materials. By adopting advanced image recognition technology and artificial intelligence detection classification algorithms, various micro defects on the wafer surface can be quickly and accurately identified, which can be applied to defect detection in wafer related processes. The equipment has advantages such as flexibility, efficiency, and high recognition accuracy.